Bayesian analysis for step-stress accelerated life testing using weibull proportional hazard model

Bayesian Analysis for Step-Stress Accelerated Life Testing using Weibull Proportional Hazard Model

In this paper, we present a Bayesian analysis for the Weibull proportional hazard (PH) model used in step-stress accelerated life testings. The key mathematical and graphical difference between the Weibull cumulative exposure (CE) model and the PH model is illustrated. Compared with the CE model, the PH model provides more flexibility in fitting step-stress testing data and has the attractive m...

Bayesian Designing and Analysis of Simple Step-Stress Accelerated Life Test with Weibull Lifetime Distribution

Survival analysis of thalassemia major patients using Cox, Gompertz proportional hazard and Weibull accelerated failure time models

Background: Thalassemia major (TM) is a severe disease and the most common anemia worldwide. The survival time of the disease and its risk factors are of importance for physicians. The present study was conducted to apply the semi-parametric Cox PH model and use parametric proportional hazards (PH) and accelerated failure time (AFT) models to identify the risk factors related to survival of TM ...

A general Bayes weibull inference model for accelerated life testing

ABSTRACT: This article presents the development of a general Bayes inference model for accelerated life testing. The failure times at a constant stress level are assumed to belong to a Weibull distribution, but the specification of strict adherence to a parametric time-transformation function is not required. Rather, prior information is used to indirectly define a multivariate prior distributi...

Random proportional Weibull hazard model for large-scale information systems

Purpose – This study aims to focus on asset management of large-scale information systems supporting infrastructures and especially seeks to address a methodology of their statistical deterioration prediction based on their historical inspection data. Information systems are composed of many devices. Deterioration process i.e. wear-out failure generation process of those devices is formulated b...